Scanning Microwave Microscopy
by Grant Drenkow
Have you ever wondered what is going on electrically at the nanoscale? Do you have a need to understand the impedance across a nanotube? The good news - now you can find out. Agilent engineers and scientists have now married together a network analyzer and an atomic force microscope, making it possible to make impedance and capacitance measurements at the tip of an AFM. In fact, you can scan across a surface making these measurements.
I remember visiting a number of research facilities shortly after Agilent announced its line of AFM’s and the big question from the researchers - “When will Agilent be able to make electrical measurements at the nanoscale?” They were asking for worldclass measurements on objects that weren’t even visible through an optical microscope. In effect - that day has arrived. A whole new world of research is now available to us.
To read more, visit the Agilent nanotechnology website and click on the image in the center of the page.
