<?xml version="1.0" encoding="UTF-8"?>
<rss version="2.0"
	xmlns:content="http://purl.org/rss/1.0/modules/content/"
	xmlns:wfw="http://wellformedweb.org/CommentAPI/"
	xmlns:dc="http://purl.org/dc/elements/1.1/"
	xmlns:atom="http://www.w3.org/2005/Atom"
	xmlns:sy="http://purl.org/rss/1.0/modules/syndication/"
	>

<channel>
	<title>AFM New Origins Blog</title>
	<atom:link href="http://www.afmuniversity.org/blog/feed/" rel="self" type="application/rss+xml" />
	<link>http://www.afmuniversity.org/blog</link>
	<description>AFM New Origins Blog</description>
	<pubDate>Tue, 09 Jun 2009 17:45:27 +0000</pubDate>
	<generator>http://wordpress.org/?v=2.7</generator>
	<language>en</language>
	<sy:updatePeriod>hourly</sy:updatePeriod>
	<sy:updateFrequency>1</sy:updateFrequency>
			<item>
		<title>Power Spectral Density Analysis</title>
		<link>http://www.afmuniversity.org/blog/2009/03/17/power-spectral-density-analysis/</link>
		<comments>http://www.afmuniversity.org/blog/2009/03/17/power-spectral-density-analysis/#comments</comments>
		<pubDate>Wed, 18 Mar 2009 02:44:49 +0000</pubDate>
		<dc:creator>Michael Serry</dc:creator>
		
		<category><![CDATA[Microscopy]]></category>

		<guid isPermaLink="false">http://www.afmuniversity.org/blog/?p=120</guid>
		<description><![CDATA[In an earlier posting on this blog about surface roughness measurement with the AFM, I wrote that the rms roughness is too often the only numerical parameter that is computed and reported (February 4, 2008). I wrote about asymmetry in the height distribution, and how the rms roughness does not address it, and used skewness [...]]]></description>
		<wfw:commentRss>http://www.afmuniversity.org/blog/2009/03/17/power-spectral-density-analysis/feed/</wfw:commentRss>
		</item>
		<item>
		<title>Silver nanoparticles</title>
		<link>http://www.afmuniversity.org/blog/2008/09/25/silver-nanoparticles/</link>
		<comments>http://www.afmuniversity.org/blog/2008/09/25/silver-nanoparticles/#comments</comments>
		<pubDate>Thu, 25 Sep 2008 21:33:04 +0000</pubDate>
		<dc:creator>Grant Drenkow</dc:creator>
		
		<category><![CDATA[Microscopy]]></category>

		<guid isPermaLink="false">http://www.afmuniversity.org/blog/?p=73</guid>
		<description><![CDATA[Silver nanoparticles are known for their anti-microbial properties and have been used in bandages, socks (to prevent foot infections), and laundry detergent. Researchers are also looking into their use for food packaging and potentially even directly into foods. Iowa State University is researching this possibility &#8212; Click HERE to see the website.
Of course the flip side of [...]]]></description>
		<wfw:commentRss>http://www.afmuniversity.org/blog/2008/09/25/silver-nanoparticles/feed/</wfw:commentRss>
		</item>
		<item>
		<title>Scanning Microwave Microscopy</title>
		<link>http://www.afmuniversity.org/blog/2008/07/30/scanning-microwave-microscopy/</link>
		<comments>http://www.afmuniversity.org/blog/2008/07/30/scanning-microwave-microscopy/#comments</comments>
		<pubDate>Wed, 30 Jul 2008 21:27:23 +0000</pubDate>
		<dc:creator>Grant Drenkow</dc:creator>
		
		<category><![CDATA[Microscopy]]></category>

		<guid isPermaLink="false">http://www.afmuniversity.org/blog/?p=69</guid>
		<description><![CDATA[Have you ever wondered what is going on electrically at the nanoscale?  Do you have a need to understand the impedance across a nanotube?  The good news - now you can find out.   Agilent engineers and scientists have now married together a network analyzer and an atomic force microscope, making it [...]]]></description>
		<wfw:commentRss>http://www.afmuniversity.org/blog/2008/07/30/scanning-microwave-microscopy/feed/</wfw:commentRss>
		</item>
		<item>
		<title>Frequency (Wavelength) Domain Analysis and Scanning Probe Microscopy Imaging</title>
		<link>http://www.afmuniversity.org/blog/2008/07/28/frequency-wavelength-domain-analysis-and-scanning-probe-microscopy-imaging/</link>
		<comments>http://www.afmuniversity.org/blog/2008/07/28/frequency-wavelength-domain-analysis-and-scanning-probe-microscopy-imaging/#comments</comments>
		<pubDate>Mon, 28 Jul 2008 21:18:51 +0000</pubDate>
		<dc:creator>Michael Serry</dc:creator>
		
		<category><![CDATA[Uncategorized]]></category>

		<guid isPermaLink="false">http://www.afmuniversity.org/blog/?p=57</guid>
		<description><![CDATA[Before it is modified and morphed into an SPM image, the underlying data, in a more primitive form, is one continuous, long sequence collected in the time-domain—a single one dimensional waveform that contains the variation of one dependent parameter, e.g. the AFM cantilever deflection, with the one independent parameter, time.
To create the image, this waveform’s [...]]]></description>
		<wfw:commentRss>http://www.afmuniversity.org/blog/2008/07/28/frequency-wavelength-domain-analysis-and-scanning-probe-microscopy-imaging/feed/</wfw:commentRss>
		</item>
		<item>
		<title>Rms roughness: the measurement that may sometimes be skewed.</title>
		<link>http://www.afmuniversity.org/blog/2008/02/04/rms-roughness-the-measurement-that-may-sometimes-be-skewed/</link>
		<comments>http://www.afmuniversity.org/blog/2008/02/04/rms-roughness-the-measurement-that-may-sometimes-be-skewed/#comments</comments>
		<pubDate>Mon, 04 Feb 2008 21:17:13 +0000</pubDate>
		<dc:creator>Michael Serry</dc:creator>
		
		<category><![CDATA[Uncategorized]]></category>

		<guid isPermaLink="false">http://www.afmuniversity.org/blog/?p=55</guid>
		<description><![CDATA[To obtain a reasonable measure of surface roughness on the nanometer scale, people most often use the atomic force microscope (AFM) or the scanning tunneling microscope (STM), not only because they offer the required resolution, but also, and more importantly, because AFM and STM images are height-encoded. This means we can measure the dimensions of [...]]]></description>
		<wfw:commentRss>http://www.afmuniversity.org/blog/2008/02/04/rms-roughness-the-measurement-that-may-sometimes-be-skewed/feed/</wfw:commentRss>
		</item>
		<item>
		<title>Nanotechnology and Football</title>
		<link>http://www.afmuniversity.org/blog/2008/01/24/nanotechnology-and-football/</link>
		<comments>http://www.afmuniversity.org/blog/2008/01/24/nanotechnology-and-football/#comments</comments>
		<pubDate>Thu, 24 Jan 2008 21:16:00 +0000</pubDate>
		<dc:creator>Grant Drenkow</dc:creator>
		
		<category><![CDATA[Uncategorized]]></category>

		<guid isPermaLink="false">http://www.afmuniversity.org/blog/?p=53</guid>
		<description><![CDATA[A colleague and I were discussing some ideas for this nanotechnology blog when we jokingly commented that if we wrote it about the Super Bowl we would probably get a lot more people tuning in to read it.  Out of sheer curiousity I ran a quick Google check on football and nanotechnology and found [...]]]></description>
		<wfw:commentRss>http://www.afmuniversity.org/blog/2008/01/24/nanotechnology-and-football/feed/</wfw:commentRss>
		</item>
		<item>
		<title>Microwave Microscope</title>
		<link>http://www.afmuniversity.org/blog/2007/12/12/microwave-microscope/</link>
		<comments>http://www.afmuniversity.org/blog/2007/12/12/microwave-microscope/#comments</comments>
		<pubDate>Wed, 12 Dec 2007 21:14:42 +0000</pubDate>
		<dc:creator>Grant Drenkow</dc:creator>
		
		<category><![CDATA[Uncategorized]]></category>

		<guid isPermaLink="false">http://www.afmuniversity.org/blog/?p=51</guid>
		<description><![CDATA[Just about the time you think you know every instrument that exists - someone comes up with a new idea.  University of Maryland researchers have come up with something they refer to as a dielectric microwave microscope.  The combination of a microwave source and a AFM probe allows one to send microwave signals [...]]]></description>
		<wfw:commentRss>http://www.afmuniversity.org/blog/2007/12/12/microwave-microscope/feed/</wfw:commentRss>
		</item>
		<item>
		<title>Nanotechnology Applications now on Agilent website</title>
		<link>http://www.afmuniversity.org/blog/2007/10/26/nanotechnology-applications-now-on-agilent-website/</link>
		<comments>http://www.afmuniversity.org/blog/2007/10/26/nanotechnology-applications-now-on-agilent-website/#comments</comments>
		<pubDate>Fri, 26 Oct 2007 21:12:37 +0000</pubDate>
		<dc:creator>Grant Drenkow</dc:creator>
		
		<category><![CDATA[Uncategorized]]></category>

		<guid isPermaLink="false">http://www.afmuniversity.org/blog/?p=49</guid>
		<description><![CDATA[Today, Agilent begins an applications section of the nanotechnology website.  The new section is a reference of nanotechnology applications showing typical instruments being used in research projects.   Each example gives a brief description of the project, the instruments used, the measurements made, and the device or structure being studied.  It also [...]]]></description>
		<wfw:commentRss>http://www.afmuniversity.org/blog/2007/10/26/nanotechnology-applications-now-on-agilent-website/feed/</wfw:commentRss>
		</item>
		<item>
		<title>AFM for Polymer Science</title>
		<link>http://www.afmuniversity.org/blog/2007/08/17/afm-for-polymer-science/</link>
		<comments>http://www.afmuniversity.org/blog/2007/08/17/afm-for-polymer-science/#comments</comments>
		<pubDate>Fri, 17 Aug 2007 21:11:38 +0000</pubDate>
		<dc:creator>Joan Horwitz</dc:creator>
		
		<category><![CDATA[Uncategorized]]></category>

		<guid isPermaLink="false">http://www.afmuniversity.org/blog/?p=47</guid>
		<description><![CDATA[AFM is a powerful characterization tool for polymer science, capable of revealing surface structures with unprecedented spatial resolution. It is extremely useful for studying the local surface molecular composition and mechanical properties of a broad range of polymer materials, including block copolymers, bulk polymers, thin-film polymers, polymer composites, and polymer blends. 
In addition to remarkably [...]]]></description>
		<wfw:commentRss>http://www.afmuniversity.org/blog/2007/08/17/afm-for-polymer-science/feed/</wfw:commentRss>
		</item>
		<item>
		<title>Phase Imaging for Composite Materials</title>
		<link>http://www.afmuniversity.org/blog/2007/08/09/phase-imaging-for-composite-materials/</link>
		<comments>http://www.afmuniversity.org/blog/2007/08/09/phase-imaging-for-composite-materials/#comments</comments>
		<pubDate>Thu, 09 Aug 2007 21:06:36 +0000</pubDate>
		<dc:creator>Grant Drenkow</dc:creator>
		
		<category><![CDATA[Uncategorized]]></category>

		<guid isPermaLink="false">http://www.afmuniversity.org/blog/?p=41</guid>
		<description><![CDATA[In my continuing effort to show you the flexibility of an atomic force microscope (AFM) - let&#8217;s look at phase imaging.
Phase Imaging is a powerful, dynamic force technique that can reveal many unique mechanical and chemical properties of a sample at the nanometer scale. In Phase Imaging, an AFM cantilever is oscillated vertically near its [...]]]></description>
		<wfw:commentRss>http://www.afmuniversity.org/blog/2007/08/09/phase-imaging-for-composite-materials/feed/</wfw:commentRss>
		</item>
	</channel>
</rss>
