AFM University Introduction to Atomic Force Microscopy by Paul West

« Cover
« Foreward
« Chapter 1
 « Chapter 2
 
2.1. Basic Concepts
2.2. The AFM Stage
2.2.1 XYZ Scanners
2.2.2 Force Sensors
2.2.3 Integrating LL-Force Sensors and Scanners
2.2.4 Z Motors-Probe Approach
2.2.5 X-Y Stage
2.2.6 Optic Microscope
2.2.7 Mechanical Loop
2.3 Electronics
2.4 AFM Acquisition Software
2.5 LL-AFM Cantilevers and Probes
2.6.1 Vibrations
2.6.2. Environmental Scanning
2.6.3 Heating/Cooling Stages
2.6.4 Higher Speed AFM Scanning
 « Chapter 3
 « Chapter 4
 « Chapter 5
 « Chapter 6
 « Chapter 7
« Appendix A
« Appendix B
« Appendix C
« Appendix D
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An AFM is a deceptively simple instrument that requires a considerable amount of engineering construct such that the AFM is capable of measuring images with nanometer resolution. The basic components of an AFM are a computer, control electronics, and a stage.
FIGURE 2-1 Photograph of a table top AFM illustrating the major components. They are a microscope stage, computer, electronic controller, computer monitor, and optical microscope monitor. The trackball is used for moving the sample stage in the X-Y axis. Most of the AFMs in use in laboratories around the world are table top units such as this. Resolution can often be enhanced by placing the microscope stage on a vibration isolation table.
The functions of each of the microscope’s components is:
Computer: Software in the computer is used for acquiring and displaying AFM images. Also, software for processing and analyzing AFM images typically resides in the computer.
Control Electronics: The control electronics generate the electronic signals required for moving stage components such as the Z motors and the XYZ scanner. The control electronics also digitize the images measured in the stage so that they can be displayed by the computer.
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