AFM University Introduction to Atomic Force Microscopy by Paul West

« Cover
« Foreward
« Chapter 1
 « Chapter 2
 
2.1. Basic Concepts
2.2. The AFM Stage
2.2.1 XYZ Scanners
2.2.2 Force Sensors
2.2.3 Integrating LL-Force Sensors and Scanners
2.2.4 Z Motors-Probe Approach
2.2.5 X-Y Stage
2.2.6 Optic Microscope
2.2.7 Mechanical Loop
2.3 Electronics
2.4 AFM Acquisition Software
2.5 LL-AFM Cantilevers and Probes
2.6.1 Vibrations
2.6.2. Environmental Scanning
2.6.3 Heating/Cooling Stages
2.6.4 Higher Speed AFM Scanning
 « Chapter 3
 « Chapter 4
 « Chapter 5
 « Chapter 6
 « Chapter 7
« Appendix A
« Appendix B
« Appendix C
« Appendix D
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Chapter 2
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FIGURE 2-22 Configuration for X-Y sample translation stage that gives very low vibration noise. The sample "chuck" is vacuum sealed to the granite base during AFM scanning.
2.2.6 Optic Microscope
The XY stage and optic are not essential for an AFM stage. The optic is used for finding the region for scanning. Also, the optic can be helpful in positioning the laser light on the cantilever in the LL-AFM force sensor.The optical microscope in an AFM can be helpful for probe approach.
FIGURE 2-23 Video camera image captured of the cantilever/sample in an AFM. The red “spot” is from the laser that is used in the light lever force sensor. Upon scanning ranges greater than 1 micron, it is possible to see the AFM cantilever move in the video microscope image.
There are three optical microscope viewing designs that may be used in an AFM stage, illustrated in Figure 2-24. The 90 degree top down design is optimal for applications when extremely high resolution optical microscope imaging is mandatory. The 45 degree design is helpful for probe approach and is used when high resolution optical imaging is not required. The 90 degree bottom view design is typically used with an inverted optical microscope for biological applications.
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