AFM University Introduction to Atomic Force Microscopy by Paul West

« Cover
« Foreward
« Chapter 1
 « Chapter 2
 
2.1. Basic Concepts
2.2. The AFM Stage
2.2.1 XYZ Scanners
2.2.2 Force Sensors
2.2.3 Integrating LL-Force Sensors and Scanners
2.2.4 Z Motors-Probe Approach
2.2.5 X-Y Stage
2.2.6 Optic Microscope
2.2.7 Mechanical Loop
2.3 Electronics
2.4 AFM Acquisition Software
2.5 LL-AFM Cantilevers and Probes
2.6.1 Vibrations
2.6.2. Environmental Scanning
2.6.3 Heating/Cooling Stages
2.6.4 Higher Speed AFM Scanning
 « Chapter 3
 « Chapter 4
 « Chapter 5
 « Chapter 6
 « Chapter 7
« Appendix A
« Appendix B
« Appendix C
« Appendix D
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Chapter 2
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d) A feedback controller that permits rapid control so that the probe can follow the topography on the surface must be created.
e) An X-Y-Z piezoelectric scanner that has linear and calibrated motion must be used.
f) A structure must be constructed that is very rigid so that the probe does not vibrate relative to the surface.
g) A high speed computer that can display the images in real time as they are collected must be used.
h) A stage that allows rapid exchange of the probe used for scanning must be created.
2.2 The AFM Stage
Figure 2-6 illustrates the primary components of an AFM stage. There is an AFM scanner that measures the force between the probe and surface and scans the probe over the surface. There is a motion control mechanism, the Z motor, which can move the AFM scanner towards the sample. There is also an X-Y positioning stage which is not required but is useful for positioning the feature for imaging under the probe as well as an optical microscope for viewing the probe and surface. A mechanical structure is required to support the AFM scanner.
FIGURE 2-6 Photograph of an AFM stage.

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