chapter4: Atomic Force Microscopy:Theory,practice,applications

AFM University Introduction to Atomic Force Microscopy by Paul West

4.1.2 Vibrating Modes

4.2 Field Modes

4.2.1 Electric Force Microscopy

4.2.2 Magnetic Force Microscopy

4.3 Material Sensing Modes

4.3.1 Lateral Force / Frictional Force

4.3.2. Vibrating Phase

4.4 Electrical Modes

4.4.1 Parametric Testing (I/V and C/V)

4.4.2 SHARK

4.4.3 Ferroelectric / Piezoelectric Testing

4.4.4 Kelvin Probe (SKPM)

4.4.5 Scanning Capacitance

4.5.1 Voltage

4.5.2 Scratching

4.5.3 Chemical Deposition

4.6 Mechanical Measurements

4.6.1 Force / Distance Curves

4.6.2 Nano Indenting

4.6.3 Frictional Measurements

4.7 Thermal Measurements

4.8 Other Modes

4.8.1 Electrochemistry

4.8.2 Scanning Tunneling Microscope

4.8.3 Pulsed Force Mode

4.8.4 Nano-Manipulation

Imaging Modes

The Atomic Force Microscope is a member of the family of scanning probe microscopes that includes the scanning tunneling microscope and the near field optical microscope, see Figure 4-1.

FIGURE 4-1 There are several types of Scanning Probe Microscopes that are used for measuring surface topography and physical properties. The primary types of SPM's are the AFM, STM and NSOM. AFM's account for about 80% of the total number of scanning probe microscopes.

Each of these microscopes measures surface topography by raster scanning a small probe across a surface and monitoring the probes motion. A scanning tunneling microscope (STM)¹ operates by monitoring the current flow between a probe and surface. In the atomic force microscope