AFM University Introduction to Atomic Force Microscopy by Paul West

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 « Chapter 4
 
4.1 Topography Modes
4.1.1 Contact Modes
4.1.2 Vibrating Modes
4.2 Field Modes
4.2.1 Electric Force Microscopy
4.2.2 Magnetic Force Microscopy
4.3 Material Sensing Modes
4.3.1 Lateral Force / Frictional Force
4.3.2. Vibrating Phase
4.4 Electrical Modes
4.4.1 Parametric Testing (I/V and C/V)
4.4.2 SHARK
4.4.3 Ferroelectric / Piezoelectric Testing
4.4.4 Kelvin Probe (SKPM)
4.4.5 Scanning Capacitance
4.5.1 Voltage
4.5.2 Scratching
4.5.3 Chemical Deposition
4.6 Mechanical Measurements
4.6.1 Force / Distance Curves
4.6.2 Nano Indenting
4.6.3 Frictional Measurements
4.7 Thermal Measurements
4.8 Other Modes
4.8.1 Electrochemistry
4.8.2 Scanning Tunneling Microscope
4.8.3 Pulsed Force Mode
4.8.4 Nano-Manipulation
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Chapter 4


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FIGURE 4-20 Vibrating Phase Mode, as the probe goes over the yellow region the phase shift between the “drive signal” and the “AFM sensor Signal” changes.
Vibrating phase images are measured simultaneously with topography images. Although vibrating phase mode gives excellent contrast on many samples, extracting quantitative data is very difficult. This is because the exact nature of the probe sample interaction is not well known. Many of the common applications for vibrating phase mode are for studying polymers and composites (see Figure 4-21).
FIGURE 4-21 Left: Topography. Right: Vibrating phase mode image of the SBS triblock copolymer.
 4.4 Electrical Modes
A conductive AFM probe may be used for measuring the electrical properties of a surface or structures located on the surface. The probe itself can be conductive or it can be made to be conductive by coating it with a metal layer. It should be pointed out that the electrical modes include EFM, (discussed in Section 4.2.1).

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