AFM University Introduction to Atomic Force Microscopy by Paul West

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4.1 Topography Modes
4.1.1 Contact Modes
4.1.2 Vibrating Modes
4.2 Field Modes
4.2.1 Electric Force Microscopy
4.2.2 Magnetic Force Microscopy
4.3 Material Sensing Modes
4.3.1 Lateral Force / Frictional Force
4.3.2. Vibrating Phase
4.4 Electrical Modes
4.4.1 Parametric Testing (I/V and C/V)
4.4.2 SHARK
4.4.3 Ferroelectric / Piezoelectric Testing
4.4.4 Kelvin Probe (SKPM)
4.4.5 Scanning Capacitance
4.5.1 Voltage
4.5.2 Scratching
4.5.3 Chemical Deposition
4.6 Mechanical Measurements
4.6.1 Force / Distance Curves
4.6.2 Nano Indenting
4.6.3 Frictional Measurements
4.7 Thermal Measurements
4.8 Other Modes
4.8.1 Electrochemistry
4.8.2 Scanning Tunneling Microscope
4.8.3 Pulsed Force Mode
4.8.4 Nano-Manipulation
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Regardless of the method of initiating the surface change there are two basic types of lithography possible with the AFM; they are a vector and dot mode, ( see Figure 4-31 ).
The patterns that are created on a surface with an AFM in lithography mode are typically generated from an input file, typically a .bmp or .jpg file. After inputting the pattern, the software generates the motions required for the probe to create the pattern on a surface. Associated with the pattern is the method for writing, the writing speed, and the mode of writing. Figure 4-32 illustrates a typical software input window. In general, the resolution of AFM lithography techniques is proportional to the diameter of the probe used for generating the pattern.
FIGURE 4-32 AFM lithography software inputs the pattern to draw and allows selection of the type of patterning.
The AFM affords one of the most economical platforms for creating nanoscale features on a surface. The versatility of the tool for lithography is substantial. However, there is one major drawback; the scan rates of an AFM are slow. Generating a pattern can be very time consuming with an AFM.
4.5.1 Voltage
In 1989 it was demonstrated that the localized current from a small probe, as in a scanning tunneling microscope, can cause changes in a material's surface11. In an AFM, current flowing from the apex of the probe to the sample can cause chemical reactions at the surface.
The most common example of AFM lithography using a potential between a probe and surface is anodic oxidation. Typically a potential is placed between a probe and a silicon wafer (see Figure 4-33). An electrochemical

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