AFM University Introduction to Atomic Force Microscopy by Paul West

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4.1 Topography Modes
4.1.1 Contact Modes
4.1.2 Vibrating Modes
4.2 Field Modes
4.2.1 Electric Force Microscopy
4.2.2 Magnetic Force Microscopy
4.3 Material Sensing Modes
4.3.1 Lateral Force / Frictional Force
4.3.2. Vibrating Phase
4.4 Electrical Modes
4.4.1 Parametric Testing (I/V and C/V)
4.4.2 SHARK
4.4.3 Ferroelectric / Piezoelectric Testing
4.4.4 Kelvin Probe (SKPM)
4.4.5 Scanning Capacitance
4.5.1 Voltage
4.5.2 Scratching
4.5.3 Chemical Deposition
4.6 Mechanical Measurements
4.6.1 Force / Distance Curves
4.6.2 Nano Indenting
4.6.3 Frictional Measurements
4.7 Thermal Measurements
4.8 Other Modes
4.8.1 Electrochemistry
4.8.2 Scanning Tunneling Microscope
4.8.3 Pulsed Force Mode
4.8.4 Nano-Manipulation
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Chapter 4


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FIGURE 4-38 Left: The frictional coefficient is defined as the frictional force divided by the normal force. Right: A frictional loop is measured by monitoring the lateral signal as it goes from left to right and right to left.
4.6.3 Frictional Measurements
The frictional coefficient of a probe moving over a surface is defined as the loading force divided by the horizontal force:
Because an AFM can measure the vertical and horizontal force (see Section 4.3.1), it is possible to measure frictional coeffi cients at the nanoscale. A frictional loop curve is first measured (see Figure 4-39); then the coefficients of friction which is proportional to W may be calculated13. Calculation of the frictional coefficient from a frictional loop requires detailed knowledge of the parameters associated with the geometry of the AFM scanner from which the measurements are derived.
FIGURE 4-39 Left: The frictional coefficient is defined as the frictional force divided by the normal force. Right: A frictional loop is measured by monitoring the lateral signal as it goes from left to right and right to left.
4.7 Thermal Measurements
By placing a small temperature sensing device at the end of an AFM probe it is possible to make a number of thermal measurements of a surface. Th e two primary types of probes used in an AFM for making thermal measurements are the thermocouple and the resistive probe, shown in Figure 4-40.
FIGURE 4-40 Left: Probe made with a thermocouple.Right: Probe made with a small resistor.

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