AFM University Introduction to Atomic Force Microscopy by Paul West

« Cover
« Foreward
« Chapter 1
 « Chapter 2
 « Chapter 3
 « Chapter 4
 
4.1 Topography Modes
4.1.1 Contact Modes
4.1.2 Vibrating Modes
4.2 Field Modes
4.2.1 Electric Force Microscopy
4.2.2 Magnetic Force Microscopy
4.3 Material Sensing Modes
4.3.1 Lateral Force / Frictional Force
4.3.2. Vibrating Phase
4.4 Electrical Modes
4.4.1 Parametric Testing (I/V and C/V)
4.4.2 SHARK
4.4.3 Ferroelectric / Piezoelectric Testing
4.4.4 Kelvin Probe (SKPM)
4.4.5 Scanning Capacitance
4.5.1 Voltage
4.5.2 Scratching
4.5.3 Chemical Deposition
4.6 Mechanical Measurements
4.6.1 Force / Distance Curves
4.6.2 Nano Indenting
4.6.3 Frictional Measurements
4.7 Thermal Measurements
4.8 Other Modes
4.8.1 Electrochemistry
4.8.2 Scanning Tunneling Microscope
4.8.3 Pulsed Force Mode
4.8.4 Nano-Manipulation
 « Chapter 5
 « Chapter 6
 « Chapter 7
« Appendix A
« Appendix B
« Appendix C
« Appendix D
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FIGURE 4-44 An AFM probe may be used to move objects on a surface. The objects may be pushed or they maybe lifted or dropped onto the surface.
References
  1. G. Binnig and H. Rohrer, Scanning Tunneling Microscopy - From Birth to Adolescence, Rev. of Mod. Phys, Vol 59, No. 3, Part 1 1987, P 615
  2. G. Binnig, C.F. Quate, Ch. Geber, Atomic Force Microscope, Phys. Rev. Letters, Vol. 56, No 9, 1986 p 930
  3. H. Heinzelmann, B. Hecht, L. Novotny, and D.W. Pohl. Forbidden light scanning near-field optical microscopy. J.Microsc. 177, 115 (1995).
  4. NanoWorld Data Sheet – www.nanoworld.com
  5. J.E. Sader, J.W.M. Chon and P. Mulvaney, Rev. Sci. Instrum., 70, 3697(1999)
  6. Optimizing AC-Mode Atomic Force Microscopy, Scanning, Vol. 18, No 5(1996) 339-343, With H. Ho.
  7. Ulcinas A, Snitka V., Intermittent contact AFM using the higher modes of weak cantilever, Ultramicroscopy. 2001 Jan;86(1-2):217- 22
  8. Y. Martin, C.C. Williams, H.K. Wickramasinghe, Atomic Force Microscopy-force mapping and profiling on a sub 100Å scale, J. Appl. Phys. 61(10) 4723
 

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