chapter7: Atomic Force Microscopy:Theory,practice,applications

AFM University Introduction to Atomic Force Microscopy by Paul West

7.1.1 Polymer Composites

7.1.2 Phase Transitions

7.1.3 Surface Texture

7.1.4 Defects

7.1.5 Crack / Scratch Propagation

7.1.6 Coatings

7.1.7 Nanoparticles

7.1.8 Carbon Nanotubes

7.1.9 Crystal Structure

7.3.3 Advanced Optical

AFM Applications

Because the AFM is capable of measuring nanometer scale images of insulating surfaces with little or no sample preparation, it has a vast number of applications in many areas of science and technology. This chapter serves as an introduction, or a snapshot, to AFM applications. The applications are presented in a "picture" format. Besides the applications listed in this chapter, Chapter 4 on Imaging Modes also presents several applications for atomic force microscopes.

The primary uses for the AFM are:

Visualization: The AFM measures three dimensional images of surfaces and is very helpful for visualizing surface topography.
Spatial Metrology : Nanometer sized dimensions of surface features are measurable with the AFM
Physical Property Maps: With many of the modes (see Chapter 4) it is possible to measure surface physical property maps. These techniques are, for the most part, qualitative.

After the initial invention of the AFM in 1986 there was a great effort focused on developing AFM instrumentation. Within a few short years, the instruments moved from being esoteric devices requiring a Ph.D. to operate to table top instruments that could be operated by technicians. From 1990 to 2000 applications for the AFM moved from fundamental physics to most areas of science and technology. It is estimated that in 2006 there are approximately 10,000 AFM's in use around the world.

126