General Bibliography

The sources listed here allow you to delve more deeply into the AFM/SPM-related research and subject matter that interests you the most. Please click on the paper title to order your PDF copy.

1. A magnetically driven oscillating probe microscope for operation in liquids
   Wenhai Han, S. M. Lindsay, Tianwei Jing
   Applied Physics Letters, Volume 69, Issue 26, pp. 4111-4113
2. Probing molecular ordering at a liquid-solid interface with a magnetically oscillated atomic force microscope
   Wenhai Han, S. M. Lindsay
   Applied Physics Letters, Volume 72, Issue 13, pp. 1656-1658
3. A solution flow system for hydrothermal–electrochemical growth of multilayered thin films
   Wojciech L. Suchanek, Tomoaki Watanabe, Bungo Sakurai, Naoki Kumagai, Masahiro Yoshimura
   Review of Scientific Instruments, Volume 70, Issue 5, pp. 2432-2437
4. Manipulation of gold nanoparticles in liquid environments using scanning force microscopy
   R. Resch, D. Lewis, S. Meltzer, N. Montoya, B. E. Koel, A. Madhukar, A. A. G. Requicha and P. Will
   Ultramicroscopy, Volume 82, Issues 1-4, February 2000, Pages 135-139
5. A system for performing simultaneous in situ atomic force microscopy/optical microscopy measurements on electrode materials for lithium-ion batteries
   L. Y. Beaulieu, V. K. Cumyn, K. W. Eberman, L. J. Krause, J. R. Dahn
   Review of Scientific Instruments, Volume 72, Issue 8, pp. 3313-3319
6. Carbon nanotube tip probes: stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors
   Cattien V Nguyen, Kuo-Jen Chao, Ramsey M D Stevens, Lance Delzeit, Alan Cassell, Jie Han, M Meyyappan
   Nanotechnology, 12 (3), p.363-367
7. Separation of optical anisotropies by angular dependent reflection anisotropy spectroscopy
   B. F. Macdonald, R. J. Cole
   Applied Physics Letters, Volume 80, Issue 19, pp. 3527-3529
8. AFM and STM study of ?-amyloid aggregation on graphite
   Zhigang Wang, Chunqing Zhou, Chen Wang, Lijun Wan, Xiaohong Fang and Chunli Bai
   Ultramicroscopy, Volume 97, Issues 1-4, October-November 2003, Pages 73-79
9. Simple test system for single molecule recognition force microscopy
   C.K. Riener, C.M. Stroh, A. Ebner, C. Klampfl, A.A. Gall, C. Romanin, Y.L. Lyubchenko, P. Hinterdorfer, H.J. Gruber
   Analytica Chimica Acta, 479, 1, pp. 59-75
10. Calibration of optical cantilever deflection readers
    Zhiyu Hu, Tim Seeley, Sebastian Kossek, Thomas Thundat
    Review of Scientific Instruments, Volume 75, Issue 2, pp. 400-404
11. Hydrodynamic damping of a magnetically oscillated cantilever close to a surface
    Christian Rankl, Vasilli Pastushenko, Ferry Kienberger, Cordula M. Stroh and Peter Hinterdorfer
    Ultramicroscopy, Volume 100, Issues 3-4, August 2004, Pages 301-308
12. Quantitative characterization of friction coefficient using lateral force microscope in the wearless regime
    P. Bilas, L. Romana, B. Kraus, Y. Bercion, J. L. Mansot
    Review of Scientific Instruments, Volume 75, Issue 2, pp. 415-421
13. An alternative isolation of tungsten tips for a scanning tunneling microscope
    E. Abelev, N. Sezin, Y. Ein-Eli
    Review of Scientific Instruments, 76
14. Atomic force microscopy of histological sections using a chemical etching method
    B. Tiribilli, D. Bani, F. Quercioli, A. Ghirelli and M. Vassalli
    Ultramicroscopy, Volume 102, Issue 3, February 2005, Pages 227-232
15. Cantilever tip probe arrays for simultaneous SECM and AFM analysis
    R.J. Fasching, Y. Tao and F.B. Prinz
    Sensors and Actuators B: Chemical, Volume 108, Issues 1-2, 22 July 2005, Pages 964-972
16. Development of a high velocity accessory for atomic force microscopy-based friction measurements
    Ewa Tocha, Tomasz Stefa?ski, Holger Schönherr, G. Julius Vancso
    Review of Scientific Instruments, 76
17. Focused ion beam-nanomachined probes for improved electric force microscopy
    Claudia Menozzi, Gian Carlo Gazzadi, Andrea Alessandrini and Paolo Facci
    Ultramicroscopy, Volume 104, Issues 3-4, October 2005, Pages 220-225
18. Iterative control of dynamics-coupling-caused errors in piezoscanners during high-speed AFM operation
    Tien, S.; Qingze Zou; Devasia, S.
    Control Systems Technology,Volume 13, Issue 6, Page(s):921 - 931
19. Scanning probe microscopes go video rate and beyond
    M. J. Rost, L. Crama, P. Schakel, E. van Tol, G. B. E. M. van Velzen-Williams, C. F. Overgauw, H. ter Horst, Dekker, B. Okhuijsen, M. Seynen, A. Vijftigschild, P. Han, A. J. Katan, K. Schoots, R. Schumm, W. van Loo, T. H. Oosterkamp, J. W. M. Frenken
    Review of Scientific Instruments, May 2005
20. An experimental study of the contact mode AFM scanning capability of polyimide cantilever probes
    Angelo Gaitas and Yogesh B. Gianchandani
    Ultramicroscopy, Volume 106, Issues 8-9, June-July 2006, Pages 874-880
21. Automated image analysis of atomic force microscopy images of rotavirus particles
    S. Venkataraman, D.P. Allison, H. Qi, J.L. Morrell-Falvey, N.L. Kallewaard, J.E. Crowe, Jr. and M.J. Doktycz
    Ultramicroscopy, Volume 106, Issues 8-9, June-July 2006, Pages 829-837
22. Direct force balance method for atomic force microscopy lateral force calibration
    David B. Asay, Seong H. Kim
    Review of Scientific Instruments, 77
23. Direct tip-position control using magnetic actuation for achieving fast scanning in tapping mode atomic force microscopy
    G. R. Jayanth, Younkoo Jeong, Chia-Hsiang Menq
    Review of Scientific Instruments, 77
24. Direct tip-sample interaction force control for the dynamic mode atomic force microscopy
    Younkoo Jeong, G. R. Jayanth, Sissy M. Jhiang, Chia-Hsiang Menq
    Applied Physics Letters, 88
25. Dynamic-force spectroscopy measurement with precise force control using atomic-force microscopy probe
    Osamu Takeuchi, Takaaki Miyakoshi, Atsushi Taninaka, Katsunori Tanaka, Daichi Cho, Machiko Fujita, Satoshi Yasuda, Suzanne P. Jarvis, and Hidemi Shigekawa
    Journal of Applied Physics, 100
26. Improving the contrast of topographical AFM images by a simple averaging filter
    F. Kienberger, V.P. Pastushenko, G. Kada, T. Puntheeranurak, L. Chtcheglova, C. Riethmueller, C. Rankl, A. Ebner and P. Hinterdorfer
    Ultramicroscopy, Volume 106, Issues 8-9, June-July 2006, Pages 822-828
27. An intercepted feedback mode for light sensitive spectroscopic measurements in atomic force microscopy
    J. Smoliner, W. Brezna
    Review of Scientific Instruments, 78
28. Comparative dynamics of magnetically, acoustically, and Brownian motion driven microcantilevers in liquids
    Xin Xu / Arvind Raman
    Journal of Applied Physics, v.102, 2007
29. Comparison of different aminofunctionalization strategies for attachment of single antibodies to AFM cantilevers
    Andreas Ebner, Peter Hinterdorfer and Hermann J. Gruber
    Ultramicroscopy, Volume 107, Issues 10-11, October 2007, Pages 922-927
30. Frequency response of an atomic force microscope in liquids and air: Magnetic versus acoustic excitation
    Elena T. Herruzo, Ricardo Garcia
    Applied Physics Letters, 91
31. Manufacturing and full characterization of silicon carbide-based multi-sensor micro-probes for biomedical applications
    Gemma Gabriel, Ivan Erill, Jaume Caro, Rodrigo Gómez, Dolors Riera, Rosa Villa and Philippe Godignon
    Microelectronics Journal, Volume 38, Issue 3, March 2007, Pages 406-415
32. Two color, low intensity photocurrent feedback for local photocurrent spectroscopy
    W. Brezna, G. Strasser, J. Smoliner
    Review of Scientific Instruments, 78
33. STM Contrast, Electron-Transfer Chemistry, and Conduction in Molecules
    Han, W.; Durantini, E. N.; Moore, T. A.; Moore, A. L.; Gust, D.; Rez, P.; Leatherman, G.; Seely, G. R.; Tao, N.; Lindsay, S. M.
    The Journal of Physical Chemistry B; 101(50); pp. 10719-10725
34. Adhesion Forces Measured by Atomic Force Microscopy in Humid Air
    Sedin, D. L.; Rowlen, K. L.
    Analytical Chemistry; 72(10); pp. 2183-2189
35. Nanobubbles and Their Precursor Layer at the Interface of Water Against a Hydrophobic Substrate
    Steitz, R.; Gutberlet, T.; Hauss, T.; Klosgen, B.; Krastev, R.; Schemmel, S.; Simonsen, A. C.; Findenegg, G. H.
    Langmuir; 19(6); pp. 2409-2418
36. Resistance measurements at the nanoscale: scanning probe ac impedance spectroscopy
    Anthony Layson, Shailesh Gadad and Dale Teeters
    Electrochimica Acta, Volume 48, Issues 14-16, 30 June 2003, Pages 2207-2213
37. A Tutorial on the mechanisms, dynamics, and control of atomic force microscopes
    Daniel Y. Abramovitch, Sean B. Andersson, Lucy Y. Pao, and Georg Schitter
    Proceedings of the 2007 American Control Conference
38. Observation of the surface stress induced in microcantilevers by electrochemical redox processes
    F. Tian, J. H. Pei, D. L. Hedden, G. M. Brown and T. Thundat
    Ultramicroscopy, Volume 100, Issues 3-4, August 2004, Pages 217-223
39. Tip to substrate distances in STM imaging of biomolecules
    Dario Alliata, Laura Andolfi and Salvatore Cannistraro
    Ultramicroscopy, Volume 101, Issues 2-4, November 2004, Pages 231-240
40. The effect of the shape of a tip's apex on the fabrication of an AFM tip with an attached single carbon nanotube
    Hyung Woo Lee, Soo Hyun Kim, Yoon Keun Kwak, Eung Sug Lee and Chang Soo Han
    Sensors and Actuators A: Physical, Volume 125, Issue 1, 21 October 2005, Pages 41-49
41. Surface attachment of ligands and receptors for molecular recognition force microscopy
    Peter Hinterdorfer, Hermann J. Gruber, Ferry Kienberger, Gerald Kada, Christian Riener, Cordula Borken and Hansgeorg Schindler
    Colloids and Surfaces B: Biointerfaces, Volume 23, Issues 2-3, February 2002, Pages 115-123
42. Atomic force microscopy for the analysis of environmental particles
    Kathryn A. Ramirez-Aguilar, David W. Lehmpuhl, Amy E. Michel, John W. Birks and Kathy L. Rowlen
    Ultramicroscopy, Volume 77, Issues 3-4, July 1999, Pages 187-194
43. Two-component atomic force microscopy recognition imaging of complex samples
    H. Wang, R. Bash and D. Lohr
    Analytical Biochemistry, Volume 361, Issue 2, 15 February 2007, Pages 273-279
44. Geometric artefact suppressed surface potential measurements
    Minhwan Lee, Wonyoung Lee, Fritz B Prinz
    Nanotechnology, 17 (15), p.3728-3733