AFM/SPM E-SEMINARS

These recorded seminars feature researchers and experts presenting various AFM/SPM principles, technologies, applications, and performance-optimizing tips.

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Back to the Basics: Techniques and Skills for Difficult AFM Samples
Running time: 1 hour
April 26, 2012
Speakers: Song Xu, Ph.D., Agilent Technologies, Inc.

Some of us AFM users have this experience: following the instrument manual, we could easily image most of the sample easily and quickly. As a matter of fact, 80% of the AFM work done at a centralized facility is simple imaging of easy samples in air. However, many of us are also confronted with difficult samples that could cost us much time and effort. Very often even after following the manual does not help make difficult samples any easier. In this web seminar, we will focus on the techniques and skills of some of the difficult samples, and use actual example to illustrate the possible solutions to unique problems.

Answering Really Basic Questions that AFM Novice Users are Afraid to Ask
Running time: 1 hour 10 minutes
October 18, 2011
Speakers: Song Xu, Ph.D, Agilent Technologies

New AFM instrument owners often have many important questions that are not usually addressed in publications, books, and presentations: “What are the basic laboratory requirements for the instrument? What might I do that could accidentally damage the instrument? What kind of maintenance does the instrument need on a daily basis?”

We will answer many questions about basic laboratory requirements and procedures, as well as proper instrument usage and maintenance. Some of these practices are unique to AFM, such as remedies for noise-related issues and scanner calibration and adjustment, whereas some practices can be applied to other research instruments, such as strategies for dealing with thermal drift, preventing sample contamination, and ensuring a good working environment.

Basic AFM Image Processing: Techniques, Theories, and Examples
Running Time: 1 hour 8 minutes
September 27, 2011
Speakers: Song Xu, Ph.D, Agilent Technologies

Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) images contain many levels of information, as well as many potential problems such as noise, misalignment, disturbance, spike, tilt, bow, and various artifacts. After acquiring an image, AFM users need to process and export the raw data into a format that can be utilized for publication and presentation. An appropriate chain of processing, filtering, and rendering allows each AFM user to display data in a way that reveals the most information via the best looking image.

We will present several steps of the basic processing that almost every image must undergo, as well as a few more advanced image processing techniques. First we will discuss a series of basic data processing steps, including plan flatten, plan de-parabola, smooth filter, median filter, FFT filter, high pass filter, and low pass filter. Then we will discuss several data rendering techniques, including 2D topography, 3D topography, and 3D topography with overlay texture mapping. Practical “real world” examples will be presented, as will the image processing’s physics and math.

AFM Troubleshooting Basics
Running time: 44 minutes
March 25, 2011
Speakers: Dr. Song, Xu, Agilent Technologies, Inc.

How to Troubleshoot an Atomic Force Microscope
Most AFM-related problems do not involve hardware defects and can be diagnosed without an engineering background. We will discuss several topics here, including: tip-related problems, parameter-related problems, sample-mounting-related problems, connection problems, noise-related problems, and drift sources and solutions.

Beyond Tapping Mode
Running time: 41 minutes
October 27, 2010
Speakers: Song Xu, Ph.D., Agilent Technologies

Imaging Modes Based on the Oscillation of an AFM Cantilever
Many advanced imaging modes based on cantilever oscillating technology have been developed to map the physical and chemical properties of materials. Such imaging modes include phase imaging, magnetic force microscopy, electrostatic force microscopy, Kelvin force microscopy, and scanning microwave microscopy, among others. We will discuss the basic physics behind these advanced AC imaging modes, the mathematics of the feedback mechanisms utilized, and several example applications drawn from a variety of research fields.

Plants, Animals, and AFM
Running Time 1 hour and 1 minute
October 26, 2010
Speakers: Topic 1: Scott C. Lenaghan, Ph.D. (University of Tennessee, Knoxville) Topic 2: W. Travis Johnson, Ph.D. (Agilent Technologies)

Topic 1: AFM Imaging of the Natural World: Plant Nanotechnology
Nanotechnology is one of the most rapidly growing fields in all of science. While traditionally this field has been dominated by manufactured nanostructures, a current trend is emerging that focuses on examining naturally occurring nanostructures generated in the natural world. We will examine some of the exciting nanostructures created by many different types of plants, as well as their potential applications in the field of biomedical engineering. We will further demonstrate how the Agilent 6000ILM atomic force microscope is a cutting-edge tool for integration with these biological systems.

Topic 2: Combining AFM with Optical Microscopy
The Agilent 6000ILM atomic force microscope can be operated with all popular optical imaging modes, including brightfield (Kohler) illumination, differential interference contrast (DIC), phase contrast, and fluorescence, so even highly opaque or translucent samples can be located with an inverted light microscope and further investigated via AFM. High-precision optical/AFM image overlays, exclusive MAC Mode (for AFM imaging in liquid), special PicoTREC topography and recognition imaging mode, and force spectroscopy are among the instrument’s key capabilities. Examples of DNA imaging, and various AFM imaging techniques combined with optical microscopy on living and fixed mammalian cells will be presented.

Lively Complements
Running Time 45 minutes
October 21, 2010
Speakers: Topic 1: Gerald Kada, Ph.D. (Agilent Technologies, Linz, Austria); Topic 2: Memed Duman, Ph.D. (Institute for Biophysics, University of Linz, Austria); Topic 2 Memed Duman, Ph.D. (Institute for Biophysics, University of Linz, Austria)

Topic 1: Combining Light Microscopy with Scanning Probe Microscopy for Biological Applications
The combination of fluorescence microscopy and AFM has great potential for single-molecule-detection applications, overcoming the limitations inherent to each technique and revealing more detailed information about structure and localization of membrane and cytoskeleton features. AFM itself has evolved from a mere nanoscale visualization tool into a complex mechanical and biological sensing tool via use of modified tips for biological recognition imaging.

Topic 2: Accurate Localization of Cell Membrane Receptors Using Combined Fluorescence and Recognition Imaging
A new platform of combined fluorescence and simultaneous topography and recognition imaging (TREC) for improved localization of cell receptors will be presented. While expression level, distribution, and localization of YFP-labeled CD1d molecules on α-galactosylceramide (αGalCer)-loaded THP1 cells were detected with fluorescence microscopy, nanoscale distribution of binding sites was investigated with molecular recognition imaging via a chemically modified AFM tip. Using TREC on an inverted light microscope, recognition sites of cell receptors were detected in recognition images with domain sizes ranging from ~25 to ~160 nm, with the smaller domains corresponding to single CD1d molecules.

Resolution and Research
Running time: 1 hour 4 minutes
April 13, 2010
Speakers: Song Xu, PhD, Agilent Technologies and Jiwen Zheng, Ph.D., Nanotechnology Characterization Laboratory, SAIC-Frederick, National Cancer Institute at Frederick

Topic 1: Managing Variables: The Quick Approach to Everyday High Resolution with AFM
This presentation will focus on a systematic approach to achieve high-resolution AFM by managing the variables encountered in everyday operation. For instance, suppose a new and unknown research sample presents ten variables in sample preparation, five variables in tip selection, and ten variables in imaging parameters. The 500 compounded variables make it difficult and time consuming to obtain good quality data. However, employing a systematic approach to fix the variables and manage the unknown factors can greatly reduce time and effort. Real research examples (i.e., AC mode imaging of protein and nanoparticles, contact mode imaging of atomic steps in air and in fluid) will be discussed.

Topic 2: Cancer Nanotechnology: Preclinical Characterization
Advances in nanotechnology research are bringing about radical changes in the early detection, diagnosis, and treatment of cancer. Many nano-medicines for targeted drug delivery have matured beyond the discovery phase of research. Such targeted nano-drug delivery systems can minimize drug dose as well as reduce systemic toxicity and the adverse side effects of chemotherapeutics, thereby increasing overall therapeutic.

Basics for Biology
Running time: 1 hour 10 minutes
March 30, 2010
Speakers: Song Xu, PhD, Agilent Technologies, Inc. and Dr. Dong Han, China Center for Nanoscience and Nanotechnology

Topic 1: Back to Basics for High Resolution Imaging
We hear comments from AFM researchers about the difficulties to obtain high resolution. Many AFM operators often jump into an unknown samples with a familiar cantilever and parameters, they often start to experience time consuming difficulties to achieve good resolution. This presentation focuses on 5 systematic steps in order to approach high resolution imaging in a every day AFM operation.

Topic 2: Applications of MAC Mode for Imaging in Liquid
Atomic Force Microscopes is a powerful analytical instrument for life sciences. It can be used to obtain highly accurate nanometer-scale images in liquid if you use the correct techniques. Prof. Liau will discuss using MAC Mode in liquid on very sticky, soft biology samples and give many examples if live cell samples.

I Know I Can, But Should I
Running time: 53 minutes
March 16, 2010
Speakers: Jenny Hay, Agilent Technologies, Jing-Jiang Yu, Agilent Technologies

AFM and Nanoindenting: The Pros and Cons of Stretching Functionality
AFMs are specially designed for high-resolution imaging, and Nanoindenters (NI) are specially designed for measuring mechanical properties. However, because AFMs and NIs share some operating principles, their functions have some degree of crossover. We will address the pros & Cons of using one type of instrument to perform the intended function of the other.

Resolution and Research
Running time: 58 minutes
March 4, 2010
Speakers: Song Xu, PhD, Agilent Technologies; Anil K. Patri, Ph.D., Deputy Director, Nanotechnology Characterization Laboratory, National Cancer Institute

Topic 1: Managing Variables: The Quick Approach to Everyday High Resolution with AFM
This presentation will focus on a systematic approach to achieve high-resolution AFM by managing the variables encountered in everyday operation. For instance, suppose a new and unknown research sample presents ten variables in sample preparation, five variables in tip selection, and ten variables in imaging parameters. The 500 compounded variables make it difficult and time consuming to obtain good quality data. However, employing a systematic approach to fix the variables and manage the unknown factors can greatly reduce time and effort. Real research examples (i.e., AC mode imaging of protein and nanoparticles, contact mode imaging of atomic steps in air and in fluid) will be discussed

Topic 2:Cancer Nanotechnology: Preclinical Characterization
Advances in nanotechnology research are bringing about radical changes in the early detection, diagnosis, and treatment of cancer. Many nano-medicines for targeted drug delivery have matured beyond the discovery phase of research. Such targeted nano-drug delivery systems can minimize drug dose as well as reduce systemic toxicity and the adverse side effects of chemotherapeutics, thereby increasing overall therapeutic efficacy. This presentation will provide a general overview of our preclinical work with special emphasis on physico-chemical characterization.

Expanding Characterization of Materials with Kelvin Force Microscopy
Running time: 69 minutes
November 10th, 2009
Speakers: Sergei Magonov, Ph.D., Senior Research Scientist, Agilent Technologies, Inc.

Expanding Characterization of Materials with Kelvin Force Microscopy
In this seminar, Sergei Magonov will introduce high-resolution, single-pass Kelvin force microscopy. Its applications to different materials (e.g., metals, semiconductors, and organic systems) will also be presented.

Immobilization Techniques of Biological Samples for Aqueous AFM Imaging and Basic to Advanced Sample Preparation for Biological Imaging
Running time: 57 minutes
October 27, 2009
Speakers: Dr. Andreas Ebner , University of Linz; Dr. Gerald Kada, Agilent Technologies

Immobilization Techniques of Biological Samples for Aqueous AFM Imaging
The immobilization of biological samples is a critical part of bio-AFM imaging. On one hand, the biological activity has to be kept intact; on the other hand, the fixation of the biological sample has to be sufficiently stable, last sufficiently long, and stay tight, while the roughness induced by the coupling should be kept to a minimum. Dr. Ebner will discuss several strategies, including simple electrostatic binding of proteins with positive net charge, use of bivalent ions to bind positively charged molecules like DNA, covalent binding of single proteins, artificial (e.g., S-layer and purple membrane) and native (e.g., membrane red blood cells and nuclear envelope).

Basic to Advanced Sample Preparation for Biological Imaging
Proper preparation is a prelude to successful life science AFM imaging. Dr. Kada will discuss the basics of sample preparation for fixed- and live-cell imaging, cell membranes, proteins, and DNA. He will then discuss techniques for high-resolution imaging in buffer and the most common misconceptions concerning sample preparation.

The Physics of TREC Imaging and The 5 Best PicoTREC Papers
Running time: 48 minutes
October 15, 2009
Speakers: Dr. Peter Hinterdorfer, University of Linz; Dr. Gerald Kada, Agilent Technologies

The Physics of TREC Imaging
Simultaneous topography and recognition imaging (TREC) allows the investigation of receptor distributions on natural biological surfaces under physiological conditions. Based on atomic force microscopy in combination with a cantilever tip carrying a ligand molecule, it enables simultaneous sensing of topography and recognition of receptor molecules with nanometer accuracy. Here, Dr. Hinterdorfer will introduce optimized handling conditions and physical properties of the cantilever-tip-sample ensemble, which are essential for proper interpretation of experimental data gained from this technique.

The 5 Best PicoTREC Papers
Dr. Kada will present the basic Agilent PicoTREC technique for simultaneous topography and recognition imaging. He will then present excerpts and data from the five most recognized published papers associated with PicoTREC.

Understanding and Choosing the Correct Cantilever for Your Application
Running time: 66 minutes
May 13, 2009
Speakers: Oliver Krause, PhD NanoWorld Group; Arvind Raman, PhD -Purdue University

"Probe Manufacturing - Why Probes Look the Way They Do"
In this seminar, Dr Krause will explain the reason why probes have many shapes, the different probe types that are available and what extra refinements can be done for various applications. This seminar will also give you a guide line of how to choose the correct probe for your application.

"VEDA: a free online simulation tool for the AFM community"
VEDA (Virtual environment for dynamic AFM) is a suite of free, cyber-enabled tools available on www.nanohub.org that simulate tapping mode AFM using magnetic/acoustic excitation (MAC/AAC) on organic and inorganic surfaces in liquids as well as ambient conditions. In this seminar, a brief introduction to the tools and their use in choosing cantilevers and operating conditions for optimal imaging will be presented

Identifying Artifacts and Optimizing AFM Images
Running time: 64 minutes
April 30, 2009
Speakers: Paul West, PhD. & Gilbert Min, PhD, Agilent Technologies

Identifying unwanted artifacts is essential for correct interpretation of images measured with an AFM. This presentation outlines the primary sources of artifacts in images and how the artifacts appear in AFM images. We will discuss the options that may exist to eliminate them or to reduce their impact on your measurements. We will demonstrate how to filter images for enhanced visualization and ways to improve the accuracy of a measurement. We will also discuss the use of post processing software for image data analysis, filtering for high-quality images, and filtering for metrological data.

Seeing the Nanostructure of DNA and Proteins
Running time: 56 minutes
April 21, 2009
Speakers: Wael Mamdouh, PhD University of Aarhus, Interdisciplinary Nanoscience Center (iNANO); Gerald Kada, PhD, Sr. Scientist, Agilent Technologies

Designing & Imaging DNA Nanostructure
We investigate the self-assembly of artificial DNA structures and arrays into predesigned nanoarchitectures on surfaces in order to characterize and explore their basic properties by using scanning tunneling microscope (STM) and atomic force microscope (AFM). This presentation will focus on the unique ability of scanning probe microscope (SPM) technique to visualize self-assembled DNA/RNA nucleobases at the liquid/solid interface by STM with submolecular resolution and more complex two-dimensional (2D) DNA nanostructures by AFM. Wael will also demonstrate a user-friendly software package that iNANO developed for designing DNA origami structures and demonstrate its use by the design of a dolphin-like DNA origami structure.

Elucidating Structure and Function of Proteins with AFM
Proteins, among the most essential parts of organisms, have structural or mechanical functions & are important agents in cell signaling and cell adhesion, or act as enzymes in catalytic processes. The high mechanical sensitivity makes the AFM a perfect tool for imaging proteins in their native environment and thereby resolving fine structural details. This e-Seminar will show examples of high resolution imaging of proteins under physiological conditions, including multi-frequency techniques, as well as force spectroscopy for measuring intra- and inter-molecular interactions leading to kinetic and thermodynamic information of protein-related systems.

Single Molecule Conductance of DNA Bases and Sequencing by Tunneling; Imaging Nucleic Acids with the AFM
Running time: 56 minutes
April 8, 2009
Speakers: Stuart Lindsay, PhD Arizona State University, Edward and Nadine Carson Professor of Physics and Chemistry Biodesign Institute; W. Travis Johnson, PhD, Research Scientists, Agilent Technologies

Single Molecule Conductance of DNA Bases and Sequencing by Tunneling
The scanning probe microscope is a great tool for measuring the conductance of single molecules. Tunneling current measurements are sensitive to the hydrogen bonding between base-pairs, while measurements of the conductance of base-nucleoside pairs yields a value for their absolute conductance, opening the way to design of a device that sequences DNA by means of tunneling measurements.

“Imaging Nucleic Acids with the AFM”
Atomic Force Microscopy (AFM) can be used to obtain highly accurate, nanometer scale images of nucleic acids, including DNA and RNA, in air or in physiological conditions. This makes the AFM a powerful analytical tool to study the structure and function of DNA. In this seminar the study of nucleic acids via AFM will be discussed and explored.

Imaging in Liquids with AFM
Running time: 63 minutes
March 26, 2009
Speakers: Arvind Raman, PhD Purdue University, School of Mechanical Engineering; W. Travis Johnson, PhD Research Scientist, Agilent Technologies

"VEDA: a free online simulation tool for the AFM community"
VEDA (Virtual environment for dynamic AFM) is a suite of free, cyber-enabled tools available on www.nanohub.org that simulate tapping mode AFM using magnetic/acoustic excitation (MAC/AAC) on organic and inorganic surfaces in liquids as well as ambient conditions. In this seminar, a brief introduction to the tools and their use in choosing cantilevers and operating conditions for optimal imaging will be presented.

"Imaging in Liquids with AFM"
Unlike competing nanoscale imaging techniques, Atomic Force Microscopy (AFM) can be used to obtain high resolution images of samples under a wide variety of environments. This includes air, reactive or inert gases, solvents, aqueous buffers and even cell growth media; the latter two of which are critical to maintain the viability of many biological samples. In this seminar, the advantages and some of the challenges of imaging samples under liquids will be presented

Expanding Characterization of Materials with Kelvin Force Microscopy
Running time: 66 minutes
March, 12, 2009
Speakers: Sergei Magonov, PhD Senior Research Scientist, Agilent Technologies

The high-resolution single-pass Kelvin force microscopy will be introduced and its applications to different materials (metals, semiconductors, organic systems, etc) will be presented.

AFM Imaging in Liquids
Running time: 39 minutes
May 7, 2008
Speakers: David Kaftan, PhD University of South Bohemia & Gerald Kada PhD Agilent Technologies

Attaining high resolution AFM images in liquid can be challenging. This seminar will discuss AFM imaging techniques for soft samples in aqueous buffers and how to obtain detailed structural information for biological samples in their native, physiological environments - For example, nucleic acids, proteins, lipids, eukaryotic and prokaryotic cells and subcellular structures.

AFM Image Optimization
Running time: 61 minutes
December, 16, 2008
Speakers: Michael Serry, Gilbert Min, Agilent Technologies, Inc.

Collect the best AFM images possible! This seminar will address key topics such as recognizing a reasonable image; a low-fidelity image; or an image that is useless because it has many artifacts. It will identify some common artifacts, and the options that may exist to eliminate them or to reduce their impact on your measurements We will demonstrate how to filter images for enhanced visualization and ways to improve the accuracy of a measurement. We will also discuss the use of post processing software for image data analysis, filtering for high-quality images, and filtering for metrological data.

AFM Imaging in Liquids
Running time: 65 minutes
November 7, 2007
Speakers: Travis Johnson, PhD, Agilent Technologies and Stuart Lindsay, PhD ASU

Attaining high resolution AFM images in liquid can be challenging. This seminar will discuss AFM imaging techniques for soft samples in aqueous buffers and how to obtain detailed structural information for biological samples in their native, physiological environments - For example, nucleic acids, proteins, lipids, eukaryotic and prokaryotic cells and subcellular structures.

New Frontiers in Soft Materials Imaging
Running time: 58 minutes
October, 28, 2008
Speakers: Srinivas Manne, PhD Department. of Physics, University of Arizona; Jing Jiang Yu, PhD., Agilent Technologies, Inc.

Session 1 - Detecting Gas Flow and Diffusion in Two and Three Dimensions by AFM
Molecular gases, whether flowing freely in 3D or diffusing on an adsorbate surface in 2D, represent the ultimate in "soft matter" and a challenge for probe microscopy. This presentation demonstrates that the viscous drag between the imaging tip and the gas phase can serve as a contrast mechanism to image and quantify gas transport in 2D and 3D. LFM is used to detect sparsely adsorbed amphiphile films (down to few % of a monolayer) and to measure their diffusion rates through holes created in enclosing monolayer corrals. Hydrodynamic AFM is used to profile 3D gas microflows through ~100 nm pores and to map the gas permeability across nanoporous samples. We briefly discuss applications in separation science, microfluidics and nanochemistry.

Session 2 - Regulating the Surface Reaction Mechanism via an AFM-based Approach
Organodithiols on noble metals offer a promising means of generating organic thin films exhibiting reactive SH groups if molecules attach to the substrate through only one end and adopt a standing-up configuration. However, the adsorbed dithiol layers, when prepared from the widely used natural growth approach, usually yield unexpected lying-down or looped alkanedithiolates on surface due to the binding of both SH end groups. Using self-assembly of ,-alkanedithiols on gold as an example, it will demonstrate that surface reaction pathway can be controlled and regulated via an AFM-based approach, and thus to yield a preferred surface reaction product.

AFM Image Optimization & Studies of Local Electric Properties
Running time: 63 minutes
April 10, 2008
Speaker: Sergei Magonov PhD, Agilent Technologies

Optimization of Imaging in Atomic Force Microscopy -General aspects of imaging in contact and oscillatory modes will be discussed with emphasis on rational analysis of AFM images. Dependence of AFM images on experimental parameters will be reviewed. Introduction to Studies of Local Electric Properties with Atomic Force Microscopy - AFM measurements of the local electric properties are known for almost 20 years, current interest in these applications is driven by improved electronic detection and development of new modes. Single-pass techniques (Electric Force Microscopy, Kevin Force Microscopy, Scanning Piezoresponse Microscopy, etc.) offering new capabilities for visualization local charges, conducting paths, dopant mapping will be reviewed.

Electromagnetic Materials Measurements at High Spatial Resolution
Running time: 64 minutes
August 7, 2008
Speakers: Craig Wall, Ph.D., Agilent Technologies, Inc. Hassan Tanbakuchi, Ph.D. Agilent Labs

One-hour AFM eSeminar focusing on a brand new, highly sensitive imaging technique, scanning microwave microscopy (SMM) mode. This is the first and only imaging method to combine the calibrated, complex electrical measurement capabilities of a microwave performance network analyzer (PNA) with the outstanding spatial resolution of an atomic force microscope. SMM Mode outperforms traditional AFM-based scanning capacitance microscopy techniques, offering far greater application versatility, the ability to acquire quantitative results for complex impedance, calibrated dopant density and capacitance, and the highest sensitivity and dynamic range in the industry.

Higher Harmonic Imaging with AFM
Running time: 37 minutes
May 28, 2008
Speakers: Peter Hinterdorfer,PhD University of Linz & Gerald Kada Agilent Technologies

Learn all about the utilization of this exciting new imaging mode for surface characterization and life science studies! At this seminar, we will discuss how harmonic imaging works, the range of information it can provide about your sample, and harmonic-related data collection and analysis.

Sample Preparation for AFM
Running time: 57 minutes
March 27, 2008
Speakers: David Allison PhD University of Tennessee, Knoxville & Song Xu PhD Agilent Technologies

Proper sample preparation is a prelude to AFM imaging success! This seminar will cover many important aspects of sample preparation, including how to calculate the correct concentration of a sample, how to prepare living cells for imaging in liquid, and how to affix a sample to a puck for imaging in air. Common misconceptions concerning sample preparation will also be discussed.

Modern Trends in AFM for Polymers
Running time: 75 minutes
October 24, 2007
Speakers: Russell Composto, PhD University of Pennsylvania & Sergei Magonov, PhD Agilent Technologies

Recently, the strong interest in nanoscale polymer science has advanced AFM techniques and its applications. The seminar will examine samples in different environments/temperatures and how to get structural and compositional information at scales down to atomic dimensions.

Choosing the Correct Cantilever for Your Application
Running time: 70 minutes
October 18, 2007
Speakers: Philip Russell PhD Appalachian State University & Sergei Magonov PhD Agilent Technologies

Choosing the correct cantilever can be very confusing and waste your valuable research time. This seminar will help you understand the types of cantilevers on the market and explain how to choose the best one for your samples and how to optimize data.