Sergei Magonov, PhD & John Alexander
Santa Clara Meeting 2008
Atomic Force Microscopy (AFM) is well-established characterization technique for high-resolution surface imaging and its applications are expanding towards quantitative studies of local mechanical and electric properties. Recent developments in AFM instrumentation open new capabilities for simultaneous examination of electric and mechanical tip-sample interactions at multiple frequencies. Practical implementations of this approach in studies of semiconductor structures, self-assembled organic material and multicomponent polymer systems will be discussed.
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