Selected Topics of Atomic Force Microscopy Applications:High- Resolution Imaging, Studies in Different Environments and Probing of Local Electric Properties

Sergei Magonov, PhD
UNI Nanoscience Meeting

Applications of Atomic Force Microscopy (AFM) are expanding with further developments of electronic capabilities, introduction of advanced modes and use of novel probes. In recent years, there was a definite emphasis on better resolution using amplitude modulation and frequency modulation modes. Achievements and opened questions of atomic-scale and molecular-scale images in these modes will be presented and discussed. The use of broadband lock-in amplifiers and fast data acquisition leads to advanced approaches towards quantitative probing of local mechanical and electric properties. Probing of local electric properties with single-pass Kelvin Force Microscopy (KFM) will be demonstrated on samples of different kinds with emphasis on high sensitivity and lateral resolution. One of the outstanding goals of comprehensive AFM applications is a combination of high-resolution resolution imaging and quantitative probing of local properties with studies in different environments: air, liquid, vapors, etc. Several applications related with imaging of samples in at different humidity and in various vapors will be described. The examples are taken from studies of organic ultrathin layers on different substrates and polymers.

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Related Application Notes

Mac Mode Polysccarides

Polymer Surfaces

Polyvinyl Alcohol

Surfactant