General
- A magnetically driven oscillating probe microscope for operation in liquids
Wenhai Han, S. M. Lindsay, Tianwei Jing
Applied Physics Letters, Volume 69, Issue 26, pp. 4111-4113 - Probing molecular ordering at a liquid-solid interface with a magnetically oscillated atomic force microscope
Wenhai Han, S. M. Lindsay
Applied Physics Letters, Volume 72, Issue 13, pp. 1656-1658 - A solution flow system for hydrothermal–electrochemical growth of multilayered thin films
Wenhai Han, S. M. Lindsay
Applied Physics Letters, Volume 72, Issue 13, pp. 1656-1658 - Manipulation of gold nanoparticles in liquid environments using scanning force microscopy
R. Resch, D. Lewis, S. Meltzer, N. Montoya, B. E. Koel, A. Madhukar, A. A. G. Requicha and P. Will
Ultramicroscopy, Volume 82, Issues 1-4, February 2000, Pages 135-139 - A system for performing simultaneous in situ atomic force microscopy/optical microscopy measurements on electrode materials for lithium-ion batteries
L. Y. Beaulieu, V. K. Cumyn, K. W. Eberman, L. J. Krause, J. R. Dahn
Review of Scientific Instruments, Volume 72, Issue 8, pp. 3313-3319 - Carbon nanotube tip probes: stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors
Cattien V Nguyen, Kuo-Jen Chao, Ramsey M D Stevens, Lance Delzeit, Alan Cassell, Jie Han, M Meyyappan
Nanotechnology, 12 (3), p.363-367 - Separation of optical anisotropies by angular dependent reflection anisotropy spectroscopy
B. F. Macdonald, R. J. Cole
Applied Physics Letters, Volume 80, Issue 19, pp. 3527-3529 - AFM and STM study of ?-amyloid aggregation on graphite
Zhigang Wang, Chunqing Zhou, Chen Wang, Lijun Wan, Xiaohong Fang and Chunli Bai
Ultramicroscopy, Volume 97, Issues 1-4, October-November 2003, Pages 73-79 - Simple test system for single molecule recognition force microscopy
C.K. Riener, C.M. Stroh, A. Ebner, C. Klampfl, A.A. Gall, C. Romanin, Y.L. Lyubchenko, P. Hinterdorfer, H.J. Gruber
Analytica Chimica Acta, 479, 1, pp. 59-75 - Calibration of optical cantilever deflection readers
Zhiyu Hu, Tim Seeley, Sebastian Kossek, Thomas Thundat
Review of Scientific Instruments, Volume 75, Issue 2, pp. 400-404 - Hydrodynamic damping of a magnetically oscillated cantilever close to a surface
Christian Rankl, Vasilli Pastushenko, Ferry Kienberger, Cordula M. Stroh and Peter Hinterdorfer
Ultramicroscopy, Volume 100, Issues 3-4, August 2004, Pages 301-308 - Quantitative characterization of friction coefficient using lateral force microscope in the wearless regime
P. Bilas, L. Romana, B. Kraus, Y. Bercion, J. L. Mansot
Review of Scientific Instruments, Volume 75, Issue 2, pp. 415-421 - An alternative isolation of tungsten tips for a scanning tunneling microscope
E. Abelev, N. Sezin, Y. Ein-Eli
Review of Scientific Instruments, 76 - Atomic force microscopy of histological sections using a chemical etching method
B. Tiribilli, D. Bani, F. Quercioli, A. Ghirelli and M. Vassalli
Ultramicroscopy, Volume 102, Issue 3, February 2005, Pages 227-232 - Cantilever tip probe arrays for simultaneous SECM and AFM analysis
R.J. Fasching, Y. Tao and F.B. Prinz
Sensors and Actuators B: Chemical, Volume 108, Issues 1-2, 22 July 2005, Pages 964-972 - Development of a high velocity accessory for atomic force microscopy-based friction measurements
Ewa Tocha, Tomasz Stefa?ski, Holger Schönherr, G. Julius Vancso
Review of Scientific Instruments, 76 - Focused ion beam-nanomachined probes for improved electric force microscopy
Claudia Menozzi, Gian Carlo Gazzadi, Andrea Alessandrini and Paolo Facci
Ultramicroscopy, Volume 104, Issues 3-4, October 2005, Pages 220-225 - Iterative control of dynamics-coupling-caused errors in piezoscanners during high-speed AFM operation
Tien, S.; Qingze Zou; Devasia, S.
Control Systems Technology,Volume 13, Issue 6, Page(s):921 - 931 - Scanning probe microscopes go video rate and beyond
M. J. Rost, L. Crama, P. Schakel, E. van Tol, G. B. E. M. van Velzen-Williams, C. F. Overgauw, H. ter Horst, Dekker, B. Okhuijsen, M. Seynen, A. Vijftigschild, P. Han, A. J. Katan, K. Schoots, R. Schumm, W. van Loo, T. H. Oosterkamp, J. W. M. Frenken
Review of Scientific Instruments, May 2005 - An experimental study of the contact mode AFM scanning capability of polyimide cantilever probes
Angelo Gaitas and Yogesh B. Gianchandani
Ultramicroscopy, Volume 106, Issues 8-9, June-July 2006, Pages 874-880 - Automated image analysis of atomic force microscopy images of rotavirus particles
S. Venkataraman, D.P. Allison, H. Qi, J.L. Morrell-Falvey, N.L. Kallewaard, J.E. Crowe, Jr. and M.J. Doktycz
Ultramicroscopy, Volume 106, Issues 8-9, June-July 2006, Pages 829-837 - Direct force balance method for atomic force microscopy lateral force calibration
David B. Asay, Seong H. Kim
Review of Scientific Instruments, 77 - Direct tip-position control using magnetic actuation for achieving fast scanning in tapping mode atomic force microscopy
G. R. Jayanth, Younkoo Jeong, Chia-Hsiang Menq
Review of Scientific Instruments, 77 - Direct tip-sample interaction force control for the dynamic mode atomic force microscopy
Younkoo Jeong, G. R. Jayanth, Sissy M. Jhiang, Chia-Hsiang Menq
Applied Physics Letters, 88 - Dynamic-force spectroscopy measurement with precise force control using atomic-force microscopy probe
Osamu Takeuchi, Takaaki Miyakoshi, Atsushi Taninaka, Katsunori Tanaka, Daichi Cho, Machiko Fujita, Satoshi Yasuda, Suzanne P. Jarvis, and Hidemi Shigekawa
Journal of Applied Physics, 100 - Improving the contrast of topographical AFM images by a simple averaging filter
F. Kienberger, V.P. Pastushenko, G. Kada, T. Puntheeranurak, L. Chtcheglova, C. Riethmueller, C. Rankl, A. Ebner and P. Hinterdorfer
Ultramicroscopy, Volume 106, Issues 8-9, June-July 2006, Pages 822-828 - An intercepted feedback mode for light sensitive spectroscopic measurements in atomic force microscopy
J. Smoliner, W. Brezna
Review of Scientific Instruments, 78 - Comparative dynamics of magnetically, acoustically, and Brownian motion driven microcantilevers in liquids
Xin Xu / Arvind Raman
Journal of Applied Physics, v.102, 2007 - Comparison of different aminofunctionalization strategies for attachment of single antibodies to AFM cantilevers
Andreas Ebner, Peter Hinterdorfer and Hermann J. Gruber
Ultramicroscopy, Volume 107, Issues 10-11, October 2007, Pages 922-927 - Frequency response of an atomic force microscope in liquids and air: Magnetic versus acoustic excitation
Elena T. Herruzo, Ricardo Garcia
Applied Physics Letters, 91 - Manufacturing and full characterization of silicon carbide-based multi-sensor micro-probes for biomedical applications
Gemma Gabriel, Ivan Erill, Jaume Caro, Rodrigo Gómez, Dolors Riera, Rosa Villa and Philippe Godignon
Microelectronics Journal, Volume 38, Issue 3, March 2007, Pages 406-415 - Two color, low intensity photocurrent feedback for local photocurrent spectroscopy
W. Brezna, G. Strasser, J. Smoliner
Review of Scientific Instruments, 78 - STM Contrast, Electron-Transfer Chemistry, and Conduction in Molecules
Han, W.; Durantini, E. N.; Moore, T. A.; Moore, A. L.; Gust, D.; Rez, P.; Leatherman, G.; Seely, G. R.; Tao, N.; Lindsay, S. M.
The Journal of Physical Chemistry B; 101(50); pp. 10719-10725 - Adhesion Forces Measured by Atomic Force Microscopy in Humid Air
Sedin, D. L.; Rowlen, K. L.
Analytical Chemistry; 72(10); pp. 2183-2189 - Nanobubbles and Their Precursor Layer at the Interface of Water Against a Hydrophobic Substrate
Steitz, R.; Gutberlet, T.; Hauss, T.; Klosgen, B.; Krastev, R.; Schemmel, S.; Simonsen, A. C.; Findenegg, G. H.
Langmuir; 19(6); pp. 2409-2418 - Resistance measurements at the nanoscale: scanning probe ac impedance spectroscopy
Anthony Layson, Shailesh Gadad and Dale Teeters
Electrochimica Acta, Volume 48, Issues 14-16, 30 June 2003, Pages 2207-2213 - A Tutorial on the mechanisms, dynamics, and control of atomic force microscopes
Daniel Y. Abramovitch, Sean B. Andersson, Lucy Y. Pao, and Georg Schitter
Proceedings of the 2007 American Control Conference - Observation of the surface stress induced in microcantilevers by electrochemical redox processes
F. Tian, J. H. Pei, D. L. Hedden, G. M. Brown and T. Thundat
Ultramicroscopy, Volume 100, Issues 3-4, August 2004, Pages 217-223 - Tip to substrate distances in STM imaging of biomolecules
Dario Alliata, Laura Andolfi and Salvatore Cannistraro
Ultramicroscopy, Volume 101, Issues 2-4, November 2004, Pages 231-240 - The effect of the shape of a tip's apex on the fabrication of an AFM tip with an attached single carbon nanotube
Hyung Woo Lee, Soo Hyun Kim, Yoon Keun Kwak, Eung Sug Lee and Chang Soo Han
Sensors and Actuators A: Physical, Volume 125, Issue 1, 21 October 2005, Pages 41-49 - Surface attachment of ligands and receptors for molecular recognition force microscopy
Peter Hinterdorfer, Hermann J. Gruber, Ferry Kienberger, Gerald Kada, Christian Riener, Cordula Borken and Hansgeorg Schindler
Colloids and Surfaces B: Biointerfaces, Volume 23, Issues 2-3, February 2002, Pages 115-123 - Atomic force microscopy for the analysis of environmental particles
Kathryn A. Ramirez-Aguilar, David W. Lehmpuhl, Amy E. Michel, John W. Birks and Kathy L. Rowlen
Ultramicroscopy, Volume 77, Issues 3-4, July 1999, Pages 187-194 - Two-component atomic force microscopy recognition imaging of complex samples
H. Wang, R. Bash and D. Lohr
Analytical Biochemistry, Volume 361, Issue 2, 15 February 2007, Pages 273-279 - Geometric artefact suppressed surface potential measurements
Minhwan Lee, Wonyoung Lee, Fritz B Prinz
Nanotechnology, 17 (15), p.3728-3733 - A New in Situ Optical Microscope with Single Atomic Layer Resolution for Observation of Electrochemical Dissolution of Au(111)
Rui Wen, Abhishek Lahiri, Mukkannan Azhagurajan, Shin-ichiro Kobayashi, and Kingo Itaya
J. Am. Chem. Soc., 2010, 132 (39), pp 13657–13659 - Charge-Transfer Complex Study by Chemical Force Spectroscopy: A Dynamic Force Spectroscopic Approach
Richard Gil, Marie-George Guillerez, Jean-Claude Poulin, and Emmanuelle Schulz
Langmuir, 2007, 23 (2), pp 542–548 - Controlling chaos in dynamic-mode atomic force microscope
Kohei YamasueKei Kobayashib, Hirofumi Yamadaa, Kazumi Matsushigea and Takashi Hikihara
Physics Letters A
Volume 373, Issue 35, 24 August 2009, Pages 3140-3144 - Cantilevers with integrated sensor for time-resolved force measurement in tapping-mode atomic force microscopy
A. F. Sarioglu and O. Solgaard
Appl. Phys. Lett. 93, 023114 (2008); doi:10.1063/1.2959828 (3 pages) - Comparative dynamics of magnetically, acoustically, and Brownian motion driven microcantilevers in liquids
Xin Xu and Arvind Raman
J. Appl. Phys. 102, 034303 (2007); doi:10.1063/1.2767202 (8 pages) - Dynamics of tapping mode atomic force microscopy in liquids: Theory and experiments
Sudipta Basak and Arvind Raman
Appl. Phys. Lett. 91, 064107 (2007); doi:10.1063/1.2760175 (3 pages) - Extending Bell's Model: How Force Transducer Stiffness Alters Measured Unbinding Forces and Kinetics of Molecular Complexes
Emily B. Waltona, Sunyoung Leea and Krystyn J. Van Vliet
Biophysical Journal Volume 94, Issue 7, April 2008, Pages 2621-2630 - Identification of multiple oscillation states of carbon nanotube tipped cantilevers interacting with surfaces in dynamic atomic force microscopy
Arvind Raman, Mark Strus
Birck and NCN Publications - Indirect Modulation of Nonmagnetic Probes for Force Modulation Atomic Force Microscopy
Jie-Ren Li and Jayne C. Garno
Anal. Chem. 2009, 81, 1699–1706 - Influence of the macroscopic shape of the tip on the contrast in scanning polarization force microscopy images
G M Sacha, M Cardellach, J J Segura, J Moser, A Bachtold, J Fraxedas and A Verdaguer
G M Sacha et al 2009 Nanotechnology 20 - Molecular recognition imaging using tuning fork-based transverse dynamic force microscopy
Manuel Hofera, Stefan Adamsmaiera, Thomas S. van Zantenb, Lilia A. Chtcheglovaa, Carlo Manzob, Memed Dumana, Barbara Mayere, Andreas Ebnera, Manuel Moertelmaierd, Gerald Kadad, Maria F. Garcia-Parajob, Peter Hinterdorfer
Ultramicroscopy
Volume 110, Issue 6, May 2010, Pages 605-611 - Multiple impact regimes in liquid environment dynamic atomic force microscopy
John Melcher, Xin Xu, and Arvind Raman
Appl. Phys. Lett. 93, 093111 (2008); doi:10.1063/1.2976438 (3 pages) - Simple, Clickable Protocol for Atomic Force Microscopy Tip Modification and Its Application for Trace Ricin Detection by Recognition Imaging
Guojun Chen, Xinghai Ning, Bosoon Park, Geert-Jan Boons and Bingqian Xu
Langmuir, 2009, 25 (5), pp 2860–2864 - Simulating and interpreting Kelvin probe force microscopy images on dielectrics with boundary integral equations
Yongxing Shen, David M. Barnett, and Peter M. Pinsky
Rev. Sci. Instrum. 79, 023711 (2008) - Simultaneous topography and recognition imaging: physical aspects and optimal imaging conditions
Johannes Preiner, Andreas Ebner, Lilia Chtcheglova, Rong Zhu and Peter Hinterdorfer
Johannes Preiner et al 2009
Nanotechnology 20 215103 - Tip-enhanced near-field Raman spectroscopy with a scanning tunneling microscope and side-illumination optics
K. J. Yi, X. N. He, Y. S. Zhou, W. Xiong
Rev. Sci. Instrum. 79, 073706 (2008); doi:10.1063/1.2956977 (8 pages) - Two color, low intensity photocurrent feedback for local photocurrent spectroscopy
W. Brezna, G. Strasser, and J. Smoliner
Rev. Sci. Instrum. 78, 063706 (2007) - Two-axis probing system for atomic force microscopy
G. R. Jayanth, Sissy M. Jhiang, and Chia-Hsiang Menq
Rev. Sci. Instrum. 79, 023705 (2008) - A New, Simple Method for Linking of Antibodies to Atomic Force Microscopy Tips
Andreas Ebner, Linda Wildling, A. S. M. Kamruzzahan, Christian Rankl, Jürgen Wruss, Christoph D. Hahn, Martin Hölzl, Rong Zhu,Ferry Kienberger, Dieter Blaas, Peter Hinterdorfer, and Hermann J. Gruber
Bioconjugate Chem., 2007, 18 (4), pp 1176–1184 - Kelvin probe force microscopy in application to biomolecular films: Frequency modulation, amplitude modulation, and lift mode
Brad Mooresa, Francis Haneb, Lukas Engc and Zoya Leonenko
Ultramicroscopy
Volume 110, Issue 6, May 2010, Pages 708-711
11th International Scanning Probe Microscopy Conference